Resistive switching behavior of a thin amorphous rare-earth scandate: Effects of oxygen content

Surface effect on resistive switching behaviors of ZnO

(2011) Jr-Jian Ke et al.   APPLIED PHYSICS LETTERS

Improved endurance of resistive switching TiO2 thin film by hourglass shaped Magnéli filaments

(2011) Gun Hwan Kim et al.   APPLIED PHYSICS LETTERS

Interface-modified random circuit breaker network model applicable to both bipolar and unipolar resistance switching

(2011) S. B. Lee et al.   APPLIED PHYSICS LETTERS

Conduction behavior change in amorphous LaLuO3 dielectrics based on correlated barrier hopping theory

(2010) Kui Li et al.   APPLIED PHYSICS LETTERS

Resistance switching in polycrystalline BiFeO3 thin films

(2010) Kuibo Yin et al.   APPLIED PHYSICS LETTERS

On the RF Properties of Weakly Saturated SiGe HBTs and Their Potential Use in Ultralow-Voltage Circuits

(2010) Sachin Seth et al.   IEEE ELECTRON DEVICE LETTERS

Ultrathin Diffusion Barrier for Copper Metallization: A Thermally Stable Amorphous Rare-Earth Scandate

(2010) J. P. Chu et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Resistance switching properties in Pt/SrTiO3:Nb Schottky junctions studied by admittance spectroscopy

(2010) Jianyong Li et al.   Materials Science and Engineering B-Advanced Functional Solid-State Materials

The resistive switching characteristics of a Ti/Gd2O3/Pt RRAM device

(2010) Kou-Chen Liu et al.   MICROELECTRONICS RELIABILITY

Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges

(2009) Rainer Waser et al.   ADVANCED MATERIALS

Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices

(2009) Ugo Russo et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Electrical evidence of unstable anodic interface in Ru∕HfOx∕TiN unipolar resistive memory

(2008) Heng Yuan Lee et al.   APPLIED PHYSICS LETTERS

Effects of metal electrodes on the resistive memory switching property of NiO thin films

(2008) C. B. Lee et al.   APPLIED PHYSICS LETTERS

MATERIALS SCIENCE: Who Wins the Nonvolatile Memory Race?

(2008) G. I. Meijer   SCIENCE

Effect of thermal treatment on resistive switching characteristics in Pt/Ti/Al2O3/Pt devices

(2008) Chih-Yang Lin et al.   SURFACE & COATINGS TECHNOLOGY