Atomic-scale origins of bias-temperature instabilities in SiC–SiO2 structures

Published 2011 View Full Article

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Title
Atomic-scale origins of bias-temperature instabilities in SiC–SiO2 structures
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 98, Issue 6, Pages 063507
Publisher
AIP Publishing
Online
2011-02-12
DOI
10.1063/1.3554428
References
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