Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation

Published 2010 View Full Article

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Title
Analysis of subthreshold photo-leakage current in ZnO thin-film transistors using indium-ion implantation
Authors
Keywords
-
Journal
SOLID-STATE ELECTRONICS
Volume 54, Issue 11, Pages 1392-1397
Publisher
Elsevier BV
Online
2010-05-24
DOI
10.1016/j.sse.2010.04.001

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