Acceptor deactivation in individual silicon nanowires: From thick to ultrathin

Segregation Behaviors and Radial Distribution of Dopant Atoms in Silicon Nanowires

(2011) Naoki Fukata et al.   NANO LETTERS

Three-Dimensional Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy

(2010) Xin Ou et al.   ADVANCED MATERIALS

Metal-Assisted Chemical Etching of Silicon: A Review

(2010) Zhipeng Huang et al.   ADVANCED MATERIALS

Spatially resolved characterization of InGaAs/GaAs quantum dot structures by scanning spreading resistance microscopy

(2010) T. Hakkarainen et al.   APPLIED PHYSICS LETTERS

Nanoscale Free-Carrier Profiling of Individual Semiconductor Nanowires by Infrared Near-Field Nanoscopy

(2010) J. M. Stiegler et al.   NANO LETTERS

Measurement of Active Dopant Distribution and Diffusion in Individual Silicon Nanowires

(2010) Elad Koren et al.   NANO LETTERS

The use of nanocavities for the fabrication of ultrathin buried oxide layers

(2009) Xin Ou et al.   APPLIED PHYSICS LETTERS

Correlating dopant distributions and electrical properties of boron-doped silicon nanowires

(2009) Ruth A. Schlitz et al.   APPLIED PHYSICS LETTERS

Mapping Active Dopants in Single Silicon Nanowires Using Off-Axis Electron Holography

(2009) Martien I. den Hertog et al.   NANO LETTERS

Carrier Profiling of Individual Si Nanowires by Scanning Spreading Resistance Microscopy

(2009) Xin Ou et al.   NANO LETTERS

Donor deactivation in silicon nanostructures

(2009) Mikael T. Björk et al.   Nature Nanotechnology

Diameter-dependent dopant location in silicon and germanium nanowires

(2009) P. Xie et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Charge Transport Characteristics in Boron-Doped Silicon Nanowires

(2008) Sarang Ingole et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Distribution of Active Impurities in Single Silicon Nanowires

(2008) Go Imamura et al.   NANO LETTERS