Spatially resolved characterization of InGaAs/GaAs quantum dot structures by scanning spreading resistance microscopy

Published 2010 View Full Article

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Title
Spatially resolved characterization of InGaAs/GaAs quantum dot structures by scanning spreading resistance microscopy
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 4, Pages 041106
Publisher
AIP Publishing
Online
2010-07-28
DOI
10.1063/1.3467138
References
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