Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [Appl. Phys. Lett. 94, 162903 (2009)]

Title
Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [Appl. Phys. Lett. 94, 162903 (2009)]
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 4, Pages 046101
Publisher
AIP Publishing
Online
2010-07-30
DOI
10.1063/1.3467005

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