Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [Appl. Phys. Lett. 94, 162903 (2009)]

标题
Comment on “Nanometer resolution piezoresponse force microscopy to study deep submicron ferroelectric and ferroelastic domains” [Appl. Phys. Lett. 94, 162903 (2009)]
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 97, Issue 4, Pages 046101
出版商
AIP Publishing
发表日期
2010-07-30
DOI
10.1063/1.3467005

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