Impact of defect distribution on transport properties for Au/ZnO Schottky contacts formed with H2O2-treated unintentionally doped n-type ZnO epilayers

Published 2010 View Full Article

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Journal

APPLIED PHYSICS LETTERS

Volume 96, Issue 14, Pages 142102

Publisher

AIP Publishing

Online

2010-04-06

DOI

10.1063/1.3374890

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