Photon energy threshold for filling boron induced charge traps in SiO2 near the Si/SiO2 interface using second harmonic generation

Hot carrier injection from nanometer-thick silicon-on-insulator films measured by optical second-harmonic generation

(2010) Ming Lei et al.   APPLIED PHYSICS LETTERS

Resonant photoionization of defects in Si/SiO2/HfO2 film stacks observed by second-harmonic generation

(2009) J. Price et al.   APPLIED PHYSICS LETTERS

Characterization of boron charge traps at the interface of Si/SiO2 using second harmonic generation

(2009) H. Park et al.   APPLIED PHYSICS LETTERS

Ionization and shielding of interface states in native p+-Si/SiO2 probed by electric field induced second harmonic generation

(2008) T. Scheidt et al.   JOURNAL OF APPLIED PHYSICS

Negative charge and charging dynamics in Al[sub 2]O[sub 3] films on Si characterized by second-harmonic generation

(2008) J. J. H. Gielis et al.   JOURNAL OF APPLIED PHYSICS

Si-SiO2interface band-gap transition - effects on MOS inversion layer

(2008) Stanislav Markov et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE