Correlation of band edge native defect state evolution to bulk mobility changes in ZnO thin films

标题
Correlation of band edge native defect state evolution to bulk mobility changes in ZnO thin films
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 96, Issue 23, Pages 232101
出版商
AIP Publishing
发表日期
2010-06-08
DOI
10.1063/1.3424790

向作者/读者发起求助以获取更多资源

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started