Characterization of AlGaN/GaN metal-oxide-semiconductor field-effect transistors by frequency dependent conductance analysis

Published 2009 View Full Article

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Title
Characterization of AlGaN/GaN metal-oxide-semiconductor field-effect transistors by frequency dependent conductance analysis
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 94, Issue 22, Pages 223512
Publisher
AIP Publishing
Online
2009-06-08
DOI
10.1063/1.3148830
References
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