Investigation of trapping effects in AlGaN/GaN/Si field-effect transistors by frequency dependent capacitance and conductance analysis

Title
Investigation of trapping effects in AlGaN/GaN/Si field-effect transistors by frequency dependent capacitance and conductance analysis
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 12, Pages 124103
Publisher
AIP Publishing
Online
2008-09-27
DOI
10.1063/1.2990627

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