Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry

Title
Displacement detection of silicon nanowires by polarization-enhanced fiber-optic interferometry
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 93, Issue 19, Pages 193110
Publisher
AIP Publishing
Online
2008-11-13
DOI
10.1063/1.3025305

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