Interface studies of ZnO nanowire transistors using low-frequency noise and temperature-dependent I-V measurements

Published 2008 View Full Article

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Title
Interface studies of ZnO nanowire transistors using low-frequency noise and temperature-dependent I-V measurements
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 92, Issue 2, Pages 022104
Publisher
AIP Publishing
Online
2008-01-15
DOI
10.1063/1.2830005

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