Interface studies of ZnO nanowire transistors using low-frequency noise and temperature-dependent I-V measurements

标题
Interface studies of ZnO nanowire transistors using low-frequency noise and temperature-dependent I-V measurements
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 92, Issue 2, Pages 022104
出版商
AIP Publishing
发表日期
2008-01-15
DOI
10.1063/1.2830005

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