Article
Chemistry, Analytical
Jelena Lovric, Neda Najafinobar, Michael E. Kurczy, Olivier De Castro, Antje Biesemeier, Lena von Sydow, Magnus Klarqvist, Tom Wirtz, Per Malmberg
Summary: This study developed correlative methodologies to investigate iron accumulation and subcellular localization in alveolar macrophages. By using nanoscale magnetic sector secondary ion mass spectrometry (SIMS) and various high-resolution imaging technologies, they found that iron accumulates in mitochondria and electrolucent compartments such as vacuoles, lysosomes, and lipid droplets.
ANALYTICAL CHEMISTRY
(2022)
Article
Biochemistry & Molecular Biology
Deborah Charlton, Catia Costa, Steven J. J. Hinder, John F. F. Watts, Melanie J. J. Bailey
Summary: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been shown to improve fingermark recovery compared to standard processes used by police forces. This study fills the gaps in knowledge by investigating the effectiveness of ToF-SIMS in revealing fingerprints on two common surfaces and comparing it to the standard process. The results show that ToF-SIMS enhances fingerprint ridge detail and running it in both positive and negative modes is beneficial.
Article
Chemistry, Analytical
Youwei Chen, Zhuojun Xie, Shaohua Dong, Quanliang Lei, Jianfeng Gao
Summary: Nano-scale secondary ion mass spectroscopy (NanoSIMS) is a powerful tool for determining the sulfur isotope composition of micrometer-sized minerals. The proposed method in this study combines high lateral resolution with high precision, providing accurate results for delta S-34 analysis. The method has been successfully used to analyze framboidal pyrite samples, showing its applicability in determining the S isotopic characteristics of mineral deposits.
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
(2022)
Article
Materials Science, Multidisciplinary
Olga S. Ovchinnikova, Nikolay Borodinov, Artem A. Trofimov, Steven T. King, Matthias Lorenz, William Lamberti, David Abmayr, Anton Ievlev
Summary: Chemical imaging of polymers and polymer blends has traditionally been done using ToF-SIMS with limited spatial resolution, but recent work has focused on using HIM-SIMS for higher resolution. By utilizing HIM-SIMS, differentiation between PE and PP as well as imaging of phase-separated domains within PE has been achieved, demonstrating its potential for analyzing complex polymeric systems.
ACS APPLIED POLYMER MATERIALS
(2021)
Article
Materials Science, Coatings & Films
N. Sano, A. Bellew, P. Blenkinsopp
Summary: In this study, different molecular gas species for gas cluster ion beams (GCIBs), including carbon dioxide and water, were compared with argon clusters to evaluate their sputter yield and depth resolution. The results showed that (H2O)(n) GCIB exhibited reduced sputter rates, improved depth resolution, and higher sensitivity, indicating its potential in surface analysis techniques with organic materials. The study also provided guidelines for GCIB users to optimize their experimental conditions based on their specific goals.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
(2023)
Article
Engineering, Multidisciplinary
Pawel Piotr Michalowski, Jonas Muller, Chiara Rossi, Alexander Burenkov, Eberhard Baer, Guilhem Larrieu, Peter Pichler
Summary: The development of non-planar structures such as arrays of nanowires poses a challenge for determining dopant concentration. Existing techniques for 3D structures lack sensitivity, while SIMS is designed for analyzing flat samples. This work overcomes the limitation of standard SIMS approaches by covering the nanowires with photoresist, creating a flat surface. High incident angle bombardment allows for reliable information about dopant distribution along the height of the nanowires to be obtained. The SIMS analysis can be performed on an array of 1000 x 1000 nanowires with a detection limit of about 5 x 10^16 atoms/cm3 and a reasonable signal-to-noise ratio of about 10 dB.
Article
Materials Science, Multidisciplinary
Xu Xu, Chengge Jiao, Kexue Li, Min Hao, Katie. L. Moore, Timothy. L. Burnett, Xiaorong Zhou
Summary: High-spatial-resolution secondary ion mass spectrometry is a powerful tool for mapping lithium at nanoscale lateral resolution. Two state-of-the-art methods demonstrate the visualization of nanoscale Li-rich phases in an aluminium-lithium alloy, providing insight into the distribution and size of T-1 (Al2CuLi) precipitates. Correlation with high resolution electron microscopy confirms the identification of T-1 precipitates and their sizes observed during SIMS mapping.
MATERIALS CHARACTERIZATION
(2021)
Article
Instruments & Instrumentation
Y. Zhou, Y. J. Zhai, Q. Y. Jin, Y. G. Liu, L. B. Li, P. Zhang, S. Zhang, H. W. Zhao, L. T. Sun
Summary: In this paper, a compact RF ion source is presented for the production of negative oxygen ion beams for SIMS application. Experimental results show that this ion source can extract high brightness and low energy spread negative oxygen ion beams.
REVIEW OF SCIENTIFIC INSTRUMENTS
(2023)
Article
Chemistry, Analytical
Jia-Long Hao, Wei Yang, Sen Hu, Rui-ying Li, Jiang-Long Ji, Hitesh G. Changela, Yang-Ting Lin
Summary: This paper presents a novel Pb-Pb and U-Pb analytical method at a sub-micron scale using a NanoSIMS with a new RF ion source. The technique allows for high spatial resolution but may introduce depth effects, requiring adjustments in the scan area to eliminate mass fractionation. Results from zircon and lunar samples are in good agreement with reference ages within analytical uncertainties.
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
(2021)
Article
Chemistry, Analytical
Junhui Li, Lei Li, Wenqing Gao, Shoudong Shi, Jiancheng Yu, Keqi Tang
Summary: A high-performance FAIMS-IMS-MS platform was developed for exploring the conformational diversity of bradykinin. The FAIMS-IMS technique can resolve multiple conformers of (BK + H+) ions, and the separations in FAIMS and IMS dimensions are largely orthogonal, resulting in a higher overall resolving power.
ANALYTICAL CHEMISTRY
(2022)
Review
Engineering, Aerospace
Garry P. Nolan, Jacques F. Vallee, Sizun Jiang, Larry G. Lemke
Summary: This paper discusses the application of modern mass spectrometry techniques in the precise characterization, analysis, and identification of unknown materials, showing specific cases and sharing experiences that reflect the complexity and interdisciplinary nature of the field.
PROGRESS IN AEROSPACE SCIENCES
(2022)
Article
Chemistry, Analytical
Florent Penen, Rene Raave, Annemarie Kip, Sandra Heskamp, Per Malmberg
Summary: ToF-SIMS imaging is a quick and sensitive technique that can visualize HER2 specific radiotracers in ovarian and breast cancer xenograft tumor sections to reflect the heterogeneous distribution of trastuzumab.
MICROCHEMICAL JOURNAL
(2022)
Article
Chemistry, Multidisciplinary
Andrew C. Madison, John S. Villarrubia, Kuo-Tang Liao, Craig R. Copeland, Joshua Schumacher, Kerry Siebein, B. Robert Ilic, J. Alexander Liddle, Samuel M. Stavis
Summary: This article focuses on the study of the fundamental tradespace of resolution and throughput in focused-ion-beam machining. By using chromia and silica as materials, complex test structures were fabricated and characterized to explore the response of the bilayer to a focused beam of gallium cations. The results showed a super-resolution factor of up to 6+/-2 and improvements to volume throughput of at least factors of 42+/-2.
ADVANCED FUNCTIONAL MATERIALS
(2022)
Article
Instruments & Instrumentation
Klaus-Ulrich Miltenberger, Max Doebeli, Christof Vockenhuber, Hans-Arno Synal
Summary: The redesigned CHIMP probe at ETH Zurich allows simultaneous analysis of positive and negative secondary ions, studying correlations between different polarities and identifying a cluster effect in the ion yields. Measurements with small primary Cn cluster ions show the influence of cluster size on secondary ion emission multiplicity.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
(2021)
Review
Physics, Multidisciplinary
Jean-Nicolas Audinot, Patrick Philipp, Olivier De Castro, Antje Biesemeier, Quang Hung Hoang, Tom Wirtz
Summary: This paper reviews the combination of Helium Ion Microscopy (HIM) and Secondary Ion Mass Spectrometry (SIMS), highlighting the advantages of the integrated HIM-SIMS instrument. The technique is capable of producing high-resolution elemental SIMS maps, while maintaining sub-nanometric resolution in the secondary electron microscopy mode. Applications in materials research, life sciences, and geology are also presented and summarized.
REPORTS ON PROGRESS IN PHYSICS
(2021)
Article
Physics, Applied
Toshio Seki, Hiroki Yamamoto, Takahiro Kozawa, Tadashi Shojo, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo
JAPANESE JOURNAL OF APPLIED PHYSICS
(2017)
Article
Physics, Atomic, Molecular & Chemical
Prutchayawoot Thopan, Hubert Gnaser, Rika Oki, Takaaki Aoki, Toshio Seki, Jiro Matsuo
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY
(2018)
Article
Instruments & Instrumentation
P. Thopan, T. Seki, L. D. Yu, U. Tippawan, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
(2019)
Article
Instruments & Instrumentation
P. Thopan, T. Seki, L. D. Yu, U. Tippawan, J. Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
(2019)
Article
Chemistry, Multidisciplinary
Masaki Hada, Kiyoshi Miyata, Satoshi Ohmura, Yusuke Arashida, Kohei Ichiyanagi, Ikufumi Katayama, Takayuki Suzuki, Wang Chen, Shota Mizote, Takayoshi Sawa, Takayoshi Yokoya, Toshio Seki, Jiro Matsuo, Tomoharu Tokunaga, Chihiro Itoh, Kenji Tsuruta, Ryo Fukaya, Shunsuke Nozawa, Shin-ichi Adachi, Jun Takeda, Ken Onda, Shin-ya Koshihara, Yasuhiko Hayashi, Yuta Nishina
Article
Chemistry, Analytical
Hubert Gnaser, Rika Oki, Takaaki Aoki, Toshio Seki, Jiro Matsuo
ANALYTICAL CHEMISTRY
(2020)
Article
Instruments & Instrumentation
Toshio Seki, Tomoya Nonomura, Takaaki Aoki, Jiro Matsuo
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
(2020)
Article
Chemistry, Physical
Masaki Hada, Kotaro Makino, Hirotaka Inoue, Taisuke Hasegawa, Hideki Masuda, Hiroo Suzuki, Keiichi Shirasu, Tomohiro Nakagawa, Toshio Seki, Jiro Matsuo, Takeshi Nishikawa, Yoshifumi Yamashita, Shin-ya Koshihara, Vlad Stolojan, S. Ravi P. Silva, Jun-ichi Fujita, Yasuhiko Hayashi, Satoshi Maeda, Muneaki Hase
Article
Physics, Applied
Toshio Seki, Hiroki Yamamoto, Kunihiko Koike, Takaaki Aoki, Jiro Matsuo
Summary: The reactive gas cluster injection process is a plasma-free etching method that avoids damage. The study shows a relationship between etching conditions and the aspect ratio, and an equation for predicting the maximum aspect ratio.
JAPANESE JOURNAL OF APPLIED PHYSICS
(2022)
Article
Engineering, Electrical & Electronic
Toshio Seki, Kenta Ishii, Takaaki Aoki, Jiro Matsuo
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
(2020)
Article
Engineering, Electrical & Electronic
Hubert Gnaser, Wolfgang Bock, Jiro Matsuo
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
(2018)
Article
Physics, Applied
T. Seki, H. Yamamoto, T. Kozawa, K. Koike, T. Aoki, J. Matsuo
APPLIED PHYSICS LETTERS
(2017)
Proceedings Paper
Computer Science, Information Systems
Takaaki Aoki, Shoji Kajita, Hirokazu Akasaka, Hagane Takeda
2017 6TH IIAI INTERNATIONAL CONGRESS ON ADVANCED APPLIED INFORMATICS (IIAI-AAI)
(2017)
