Hydrogenated amorphous carbon thin films deposited by plasma-assisted chemical vapor deposition enhanced by electrostatic confinement: structure, properties, and modeling

Title
Hydrogenated amorphous carbon thin films deposited by plasma-assisted chemical vapor deposition enhanced by electrostatic confinement: structure, properties, and modeling
Authors
Keywords
Hydrogen Content, Rutherford Backscattering Spectrometry, Thin Film Deposition, Hardness Behavior, Elastic Recoil Detection Analysis
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 117, Issue 3, Pages 1217-1225
Publisher
Springer Nature
Online
2014-08-20
DOI
10.1007/s00339-014-8510-4

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