Detection of buried layers in silicon devices using LIBS during hole drilling with femtosecond laser pulses

Title
Detection of buried layers in silicon devices using LIBS during hole drilling with femtosecond laser pulses
Authors
Keywords
Femtosecond Laser Pulse, Laser Pulse Energy, Ablation Threshold, Laser Induce Breakdown Spectroscopy, Ablation Depth
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 111, Issue 3, Pages 791-798
Publisher
Springer Nature
Online
2013-03-02
DOI
10.1007/s00339-013-7648-9

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