Effect of processing routes on microstructure, electrical and dielectric behavior of Mg-doped CaCu3Ti4O12 electro-ceramic

Title
Effect of processing routes on microstructure, electrical and dielectric behavior of Mg-doped CaCu3Ti4O12 electro-ceramic
Authors
Keywords
Dielectric Loss, High Dielectric Constant, Select Area Electron Diffraction Pattern, CCTO Ceramic, Internal Barrier Layer Capacitor
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 112, Issue 4, Pages 891-900
Publisher
Springer Nature
Online
2012-11-29
DOI
10.1007/s00339-012-7443-z

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