The joined use of n.i. spectroscopic analyses – FTIR, Raman, visible reflectance spectrometry and EDXRF – to study drawings and illuminated manuscripts

Title
The joined use of n.i. spectroscopic analyses – FTIR, Raman, visible reflectance spectrometry and EDXRF – to study drawings and illuminated manuscripts
Authors
Keywords
-
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 92, Issue 1, Pages 103-108
Publisher
Springer Nature
Online
2008-03-27
DOI
10.1007/s00339-008-4454-x

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