Transmission electron microscopy characterization of HfO2/GaAs(001) heterostructures grown by molecular beam epitaxy

Published 2008 View Full Article

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Title
Transmission electron microscopy characterization of HfO2/GaAs(001) heterostructures grown by molecular beam epitaxy
Authors
Keywords
-
Journal
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume 91, Issue 4, Pages 585-589
Publisher
Springer Nature
Online
2008-04-09
DOI
10.1007/s00339-008-4493-3

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