Analysis Of The Interface And Its Position In C60n+Secondary Ion Mass Spectrometry Depth Profiling

Published 2008 View Full Article

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Title
Analysis Of The Interface And Its Position In C60n+Secondary Ion Mass Spectrometry Depth Profiling
Authors
Keywords
-
Journal
ANALYTICAL CHEMISTRY
Volume 81, Issue 1, Pages 75-79
Publisher
American Chemical Society (ACS)
Online
2008-12-05
DOI
10.1021/ac801352r

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