Depth Profiling Brain Tissue Sections with a 40 keV C60+Primary Ion Beam

Published 2008 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Depth Profiling Brain Tissue Sections with a 40 keV C60+Primary Ion Beam
Authors
Keywords
-
Journal
ANALYTICAL CHEMISTRY
Volume 80, Issue 6, Pages 2125-2132
Publisher
American Chemical Society (ACS)
Online
2008-02-16
DOI
10.1021/ac702127q

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.