Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy

Title
Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy
Authors
Keywords
-
Journal
ADVANCED MATERIALS
Volume 25, Issue 40, Pages 5719-5724
Publisher
Wiley
Online
2013-06-25
DOI
10.1002/adma.201300958

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