Charge modulated reflectance topography for probing in-plane carrier distribution in pentacene field-effect transistors

Published 2010 View Full Article

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Title
Charge modulated reflectance topography for probing in-plane carrier distribution in pentacene field-effect transistors
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 97, Issue 11, Pages 113302
Publisher
AIP Publishing
Online
2010-09-17
DOI
10.1063/1.3490716
References
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