Wafer Scale Synthesis and High Resolution Structural Characterization of Atomically Thin MoS2Layers
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Title
Wafer Scale Synthesis and High Resolution Structural Characterization of Atomically Thin MoS2Layers
Authors
Keywords
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Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 24, Issue 47, Pages 7461-7466
Publisher
Wiley
Online
2014-12-12
DOI
10.1002/adfm.201402519
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