Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates

Title
Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates
Authors
Keywords
-
Journal
ADVANCED FUNCTIONAL MATERIALS
Volume 22, Issue 9, Pages 1894-1905
Publisher
Wiley
Online
2012-02-16
DOI
10.1002/adfm.201102913

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