标题
Rapid Characterization of Ultrathin Layers of Chalcogenides on SiO2/Si Substrates
作者
关键词
-
出版物
ADVANCED FUNCTIONAL MATERIALS
Volume 22, Issue 9, Pages 1894-1905
出版商
Wiley
发表日期
2012-02-16
DOI
10.1002/adfm.201102913
参考文献
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