Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering

Title
Overcoming diffusion-related limitations in semiconductor defect imaging with phonon-plasmon-coupled mode Raman scattering
Authors
Keywords
-
Journal
Light-Science & Applications
Volume 7, Issue 1, Pages -
Publisher
Springer Nature
Online
2018-06-15
DOI
10.1038/s41377-018-0016-y

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