Investigation of Single-Bit and Multiple-Bit Upsets in Oxide RRAM-Based 1T1R and Crossbar Memory Arrays

Published 2015 View Full Article

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Title
Investigation of Single-Bit and Multiple-Bit Upsets in Oxide RRAM-Based 1T1R and Crossbar Memory Arrays
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 62, Issue 5, Pages 2294-2301
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-09-24
DOI
10.1109/tns.2015.2465164

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