Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
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Title
Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
Authors
Keywords
SnO<sub>2</sub> films, Schottky diode, Annealing temperature, Spin coating
Journal
Silicon
Volume 10, Issue 4, Pages 1591-1599
Publisher
Springer Nature
Online
2018-01-06
DOI
10.1007/s12633-017-9643-9
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