Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes

Title
Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
Authors
Keywords
SnO<sub>2</sub> films, Schottky diode, Annealing temperature, Spin coating
Journal
Silicon
Volume 10, Issue 4, Pages 1591-1599
Publisher
Springer Nature
Online
2018-01-06
DOI
10.1007/s12633-017-9643-9

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