Apple Defects Detection Using Principal Component Features of Multispectral Reflectance Imaging

Published 2018 View Full Article

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Title
Apple Defects Detection Using Principal Component Features of Multispectral Reflectance Imaging
Authors
Keywords
-
Journal
Science of Advanced Materials
Volume 10, Issue 7, Pages 1051-1062
Publisher
American Scientific Publishers
Online
2018-05-25
DOI
10.1166/sam.2018.3277

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