Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography

Published 2018 View Full Article

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Title
Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 190, Issue -, Pages 1-11
Publisher
Elsevier BV
Online
2018-04-07
DOI
10.1016/j.ultramic.2018.04.002

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