Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography

标题
Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomography
作者
关键词
-
出版物
ULTRAMICROSCOPY
Volume 190, Issue -, Pages 1-11
出版商
Elsevier BV
发表日期
2018-04-07
DOI
10.1016/j.ultramic.2018.04.002

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