Photo-Stable Transparent Nonvolatile Memory Thin-Film Transistors Using In–Ga–Zn–O Channel and ZnO Charge-Trap Layers

Published 2015 View Full Article

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Journal

IEEE ELECTRON DEVICE LETTERS

Volume 36, Issue 11, Pages 1153-1156

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2015-09-17

DOI

10.1109/led.2015.2479235

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