Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors

Published 2015 View Full Article

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Title
Environment-Dependent Bias Stress Stability of P-Type SnO Thin-Film Transistors
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 36, Issue 5, Pages 466-468
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-03-06
DOI
10.1109/led.2015.2409854

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