Comphy — A compact-physics framework for unified modeling of BTI

Published 2018 View Full Article

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Title
Comphy — A compact-physics framework for unified modeling of BTI
Authors
Keywords
Bias temperature instabilities, High-k dielectric materials, Semiconductor device reliability
Journal
MICROELECTRONICS RELIABILITY
Volume 85, Issue -, Pages 49-65
Publisher
Elsevier BV
Online
2018-04-25
DOI
10.1016/j.microrel.2018.04.002

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