Automated defect inspection of LED chip using deep convolutional neural network

Title
Automated defect inspection of LED chip using deep convolutional neural network
Authors
Keywords
Defect inspection, Convolutional neural network, Class activation mapping, LED chip, Classification, Localization
Journal
JOURNAL OF INTELLIGENT MANUFACTURING
Volume -, Issue -, Pages -
Publisher
Springer Nature
Online
2018-04-04
DOI
10.1007/s10845-018-1415-x

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