Automated defect inspection of light-emitting diode chips using neural network and statistical approaches

Published 2007 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches
Authors
Keywords
-
Journal
EXPERT SYSTEMS WITH APPLICATIONS
Volume 36, Issue 1, Pages 219-226
Publisher
Elsevier BV
Online
2007-10-02
DOI
10.1016/j.eswa.2007.09.014

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Ask a Question. Answer a Question.

Quickly pose questions to the entire community. Debate answers and get clarity on the most important issues facing researchers.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.