Tin-incorporated nanostructured copper indium oxide delafossite thin films: Structural, electrical and optical analysis

Published 2018 View Full Article

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Title
Tin-incorporated nanostructured copper indium oxide delafossite thin films: Structural, electrical and optical analysis
Authors
Keywords
Thin films, Delafossite, X-ray diffraction, Electrical conductivity, Transmittance, Optical band gap
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 746, Issue -, Pages 435-444
Publisher
Elsevier BV
Online
2018-02-28
DOI
10.1016/j.jallcom.2018.02.305

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