Tin-incorporated nanostructured copper indium oxide delafossite thin films: Structural, electrical and optical analysis

出版年份 2018 全文链接

标题

作者

关键词

Thin films, Delafossite, X-ray diffraction, Electrical conductivity, Transmittance, Optical band gap

出版物

Volume 746, Issue -, Pages 435-444

出版商

Elsevier BV

发表日期

2018-02-28

DOI

10.1016/j.jallcom.2018.02.305

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