Characterization technique for detection of atom-size crystalline defects and strains using two-dimensional fast-Fourier-transform sampling Moiré method

Title
Characterization technique for detection of atom-size crystalline defects and strains using two-dimensional fast-Fourier-transform sampling Moiré method
Authors
Keywords
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Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 57, Issue 4S, Pages 04FC04
Publisher
Japan Society of Applied Physics
Online
2018-03-14
DOI
10.7567/jjap.57.04fc04

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