Characterization technique for detection of atom-size crystalline defects and strains using two-dimensional fast-Fourier-transform sampling Moiré method

标题
Characterization technique for detection of atom-size crystalline defects and strains using two-dimensional fast-Fourier-transform sampling Moiré method
作者
关键词
-
出版物
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 57, Issue 4S, Pages 04FC04
出版商
Japan Society of Applied Physics
发表日期
2018-03-14
DOI
10.7567/jjap.57.04fc04

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