A Novel Coarse–Fine Method for Ball Grid Array Component Positioning and Defect Inspection

Title
A Novel Coarse–Fine Method for Ball Grid Array Component Positioning and Defect Inspection
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
Volume 65, Issue 6, Pages 5023-5031
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-09-01
DOI
10.1109/tie.2017.2748053

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