Investigation of Retention Behavior of TiOx/Al2O3 Resistive Memory and Its Failure Mechanism Based on Meyer–Neldel Rule

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Title
Investigation of Retention Behavior of TiOx/Al2O3 Resistive Memory and Its Failure Mechanism Based on Meyer–Neldel Rule
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 65, Issue 3, Pages 957-962
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-01-16
DOI
10.1109/ted.2017.2788460

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