The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique

Published 2018 View Full Article

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Title
The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 39, Issue 7, Pages 955-958
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-05-05
DOI
10.1109/led.2018.2833149

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