The Importance of Contact Resistance in High-Mobility Organic Field-Effect Transistors Studied by Scanning Kelvin Probe Microscopy

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Title
The Importance of Contact Resistance in High-Mobility Organic Field-Effect Transistors Studied by Scanning Kelvin Probe Microscopy
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 39, Issue 2, Pages 276-279
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-12-09
DOI
10.1109/led.2017.2781301

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