Insight Into the Mechanism of Tail Bits in Data Retention of Vacancy-Modulated Conductive Oxide RRAM

Published 2018 View Full Article

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Title
Insight Into the Mechanism of Tail Bits in Data Retention of Vacancy-Modulated Conductive Oxide RRAM
Authors
Keywords
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Journal
IEEE ELECTRON DEVICE LETTERS
Volume 39, Issue 4, Pages 480-483
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-03-01
DOI
10.1109/led.2018.2810513

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