Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAM

Published 2018 View Full Article

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Title
Analyzing Electric Field Effect by Applying an Ultra-Short Time Pulse Condition in Hafnium Oxide-Based RRAM
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume -, Issue -, Pages 1-1
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-06-22
DOI
10.1109/led.2018.2849507

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