Impact of Process Variations on Negative Capacitance FinFET Devices and Circuits

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Title
Impact of Process Variations on Negative Capacitance FinFET Devices and Circuits
Authors
Keywords
-
Journal
IEEE ELECTRON DEVICE LETTERS
Volume 39, Issue 1, Pages 147-150
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-11-07
DOI
10.1109/led.2017.2770158

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